Authors: L. M. Zhang, G. O. Andreev, Z. Fei, A. S. McLeod, G. Dominguez, M. Thiemens, A. H. Castro-Neto, D. N. Basov, M. M. Fogler
Journal: Physical Review B / DOI: 10.1103/PhysRevB.85.075419
Year: 2012
Applications: Nanoscale
Near-field spectroscopy of silicon dioxide thin films
August 27, 2017